Digital Logics DLD Research Article | Page 15

VLSI Design 15 Table 7: Results showing gate count (GC) and quantum cost (QC) for a selection of sequential benchmarks, both before and after adding gates for testability. Filename bbara bbsse bbtas beecount cse dk14 dk512 donfile ex1 ex2 ex3 ex4 ex5 ex7 keyb lion9 lion planet1 planet s1a s1 s8 sand shiftreg sse styr tav tbk train11 train4 Inputs 4 7 2 3 7 3 3 2 9 2 2 6 2 2 7 2 2 7 7 8 8 4 11 1 7 9 4 6 2 2 Outputs 2 7 2 4 7 5 5 1 19 2 2 9 2 2 2 1 1 19 19 6 6 1 9 1 7 10 4 3 1 1 States 10 16 6 7 16 7 4 24 20 19 10 14 9 10 19 9 4 48 48 20 20 5 32 8 16 30 4 32 11 4 Total before testability GC QC Number of lines 46 1096 14 99 1361 22 21 203 10 53 577 13 137 2922 22 104 973 14 58 491 12 67 877 13 355 3979 38 97 1924 14 51 715 12 74 618 23 43 631 12 48 680 12 110 4946 19 34 505 11 15 79 7 646 4763 38 646 4763 38 97 3668 24 197 3864 24 36 1036 11 288 4941 30 17 29 8 98 1378 22 338 6553 29 23 403 12 110 3621 19 47 742 11 18 103 7 The total overhead quantum cost of the circuit in Figure 10 is 20+ 16+ 1 0 + 5 = 51. The quantum cost of the original circuit in Figure 6 is 53. Therefore, the quantum cost overhead of the testable circuit is only 96.23%. 7. Experimental Results The process for designing the sequential reversible circuit and adding the gates for testability was applied to several sequential benchmarks from the MCNC suite of benchmarks [48]. As shown in Table 7, the additional circuitry required for making the sequential reversible circuit testable adds an average of 30% overhead, in terms of quantum cost. The highest percentage overhead occurs for the smallest circuits; this is a result of needing to copy the input and output lines several times. In larger circuits, the percentage overhead is significantly lower. GC 116 185 73 111 223 164 104 145 483 177 117 162 109 114 200 98 51 784 784 197 297 90 400 65 184 448 69 200 111 54 QC 1242 1629 285 729 3266 1229 645 1069 4797 2178 867 838 767 826 5236 621 137 6169 6169 3942 4338 1150 5609 99 1644 7319 487 3911 884 167 Total after testability Number of lines % increase in QC 18 13.30 26 19.70 14 40.40 17 26.30 26 11.80 18 26.30 16 31.40 17 21.90 42 20.60 18 13.20 16 21.30 27 35.60 16 21.60 16 21.50 23 5.90 15 23.00 11 73.40 42 29.50 42 29.50 28 7.50 28 12.30 15 11.00 34 13.50 12 241.40 26 19.30 33 11.70 16 20.80 23 8.00 15 19.10 11 62.10 8. Conclusion In this work, an improved synthesis approach for sequential reversible circuits is presented. Three design examples are demonstrated, including an arbitrary sequential circuit with 2-bit states, 1-bit input, and 1-bit output (Figure 4); a four-bit falling-edge triggered up/down counter with asynchronous load and a four-bit falling-edge triggered universal register are shown. We compare the quantum cost and the ancilla inputs of the three designs with both the replacement design technique and the direct design technique reported in [26]. The new design of the sequential circuit in Figure 4 saves 44.79% and 39.77% in quantum cost and 66.67% and 33.33% in ancilla inputs as compared to the replacement design and direct design in [26], respectively. The new counter design saves 21.28% in quantum cost with the same number of ancilla inputs as compared to the design in [26]. The new register design saves 66.36% in quantum cost and 22.22% in ancilla