E-fieldimagingtechnolo-gycansolvetheproblemsofdeterminingvariouselectricpropertiesinsideaphysicallyisolatedspaceandtheelectroniccharge/voltagestateinsideametalbox,thekindofmetrologythatwasthoughttobe e impossible.
Whenfinished,itwillenablethesafeexaminationofsealedmetalboxeswhenopeningthemcouldbedangerous,whetherit'sbecauseinsideisanexplosiveweaponoramal-functioning,high-voltagefiresetatamissile sile range.