E-Lit Solution opens up new possibilities in research , development and quality assurance
ELECTRICAL & ELECTRONICS HIGH-TECH INSTRUMENTATION
QUANTUM DESIGN
E-Lit Solution opens up new possibilities in research , development and quality assurance
InfraTec E-LIT – Lock-In Thermography for Electronics is an automated testing solution system ( as part of NDT techniques ) which allows non-contact ( electrical ) failure analysis of semiconductor material during the manufacturing process . Inhomogeneous temperature distribution , local power loss , leakage currents , resistive vias , cold joints , latch-up effects and soldering issues can be measured with Lockin Thermography . This is achieved by using the shortest measurement times combined with a highperformance thermographic camera and a specialised lock-in procedure .
Smallest defects at electronic components like point and line shunts , issues from overheating , internal ( ohmic ) shorts , oxide defects , transistor and diode failures on a PCB surface , in integrated circuits ( IC ´ s ), LED modules and battery cells can be detected and displayed in x and y positions . Additionally , it is possible to analyse stacked-die packages or multi-chip modules in z-direction with merely changing the lock-in frequency .
E-LIT is extremely powerful in resolving smallest geometrical structures as it can be equipped with strong microscopic lenses and additional SIL lenses .
E-LIT is extremely powerful in resolving smallest geometrical structures as it can be equipped with strong microscopic lenses and additional SIL lenses . Identifying smallest structures with E-LIT does not mean that the resulting field of view will also be smallest – implementing thermal cameras with detector sizes of up to ( 1,920 x 1,536 ) pixels provides large scale microscopic imaging . For even larger imaging stitching options are available .
To learn more about E-Lit and applications , please visit www . qd-uki . co . uk
52 PECM Issue 66