SOFTWARE & SYSTEMS
DIGITALTEST IS EXHIBITING
DIGITALTEST
DIGITALTEST WILL PRESENT ITS WIDE
RANGE OF AUTOMATED TEST SYSTEMS
AND VARIOUS SOFTWARE SOLUTIONS
FOR ELECTRONICS MANUFACTURING
Anyone testing PCBs should visit the
Digitaltest booth at Apex 2019. Digitaltest
will present its wide range of automated
test systems and various software
solutions for electronics manufacturing.
These include a new app for fault images,
which makes repairs much easier, and a
technology that greatly reduces test time.
NEW APP: FAULT IMAGES
SIMPLIFY REPAIR
A picture says more than 1,000 words. This
was the phrase that the developers from
the test system manufacturer Digitaltest
had in mind when they programmed
the Fault Image Browser. Here, a camera
connected via the PC takes pictures of
found failures. Photos of assembly faults,
defective components or successful repairs,
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for example, can be taken, saved and
evaluated. This app is part of the Paperless
Repair Software QMAN from Digitaltest.
It helps all common test systems to repair
faster and to observe and evaluate the
manufacturing process.
This QMAN function can help customers
to better visualize recognized defects,
especially in electronic manufacturing
services (EMS). Of course, a fault image
also supports repairs and makes it
possible to record the successful repair
photographically.
PARALLEL TEST REDUCES TEST
TIME SIGNIFICANTLY
Panelization has become indispensable in
electronics manufacturing – the advantages
are obvious: even miniature PCBs can be
tested and higher quantities can be tested
in a shorter time with less use of resources.
If, for example, the test system is to test an
eight-fold panel instead of a single unit, this
requires more time within the production
line - a jam could occur. Here, a parallel test
can reduce the test time to such an extent
that the user test fits into the cycle time
of the line. With the parallel technology
of Digitaltest, the Lambda edition, the
single boards are tested simultaneously on
the multiple panel and thus the tests are
carried out in the fastest way. This works by
performing an in-circuit test, or functional
test on two or more independent test
heads, thereby reducing the test, time by
the corresponding factor.