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Fig. 7. XRD profiles of the machined( a) electroless-plated NiP and( b) electroplated Cu surfaces.
Figure 7b. Table 1 lists the relative intensities of other reflections normalized to the( 111) reflection and the average crystallite sizes calculated from the full width at half maximum( FWHM) of each peak. The average crystallite size for each reflection ranged from 20 to 47 nm. Thus, the absence of an amorphous phase on the electroplated Cu indicates that the black regions in the EBSD grain map in Figure 6 are not amorphous, but they are micrograins smaller than 40 nm, which is below the measurement limit.