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J. Eur. Opt. Society-Rapid Publ. 22, 21( 2026)
2 Preston FW, The structure of abraded glass surfaces, Trans. Opt. Soc. 23, 141( 1922). https:// doi. org / 10.1088 / 1475- 4878 / 23 / 3 / 301.
3 Moses EI, in Proceedings of the 20th IEEE / NPSS Symposium on Fusion Engineering, San Diego, 2003( IEEE, 2003), p. 413. https:// doi. org / 10.1109 / FUSION. 2003.1426672.
4 Campbell JH, Hawley-Fedder RA, Stolz CJ, Menapace JA, Borden MR, Whitman PK, et al., in Proceedings of the Lasers and Applications in Science and Engineering, San Jose, 2004, edited by MA. Lane and CR. Wuest( Proceedings Volume 5341, Optical Engineering at the Lawrence Livermore National Laboratory II: The National Ignition Facility, San Jose, 2004), p. 84. https:// doi. org / 10.1117 / 12.538471.
5 Wang H, Ma Y, Peng G, Hang W, Jiang W, Chen H, et al., Evaluation of subsurface damage layer of BK7 glass via cross-sectional surface nanoindentation, Precis. Eng. 67, 293( 2021). https:// doi. org / 10.1016 / j. precisioneng. 2020.10.008.
6 Jiao P, Xin Q, Fan B, Wu Y, Wu X, Morphology evolution of Vickers indentation in fused silica glass etched by atmospheric pressure plasma jet, Ceram. Int. 48, 31500( 2022). https:// doi. org / 10.1016 / j. ceramint. 2022.07.069.
7 Hu G, Zhao Y, Liu X, Li D, Xiao Q, Yi K, Shao J, Combining wet etching and real-time damage event imaging to reveal the most dangerous laser damage initiator in fused silica, Opt. Lett. 38, 2632( 2013). https:// doi. org / 10.1364 / OL. 38.002632.
8 Lambropoulos JC, Li Y, Funkenbusch PD, Ruckman JL, in Proceedings of the SPIE’ s International Symposium on Optical Science, Engineering, and Instrumentation, Denver, CO, 1999( SPIE, 1999), p. 41. https:// doi. org / 10.1117 / 12.369213.
9 Fine KR, Garbe R, Gip T, Nguyen Q, in Proceedings of the Defense and Security, Orlando, 2005( SPIE, 2005), p. 105. https:// doi. org / 10.1117 / 12.602993.
10 Liu H, Ye X, Zhou X, Huang J, Wang F, Zhou X, et al., Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process, Opt. Mate. 36, 855( 2014). https:// doi. org / 10.1016 / j. optmat. 2013.11.022.
11 Lakhdari F, Belkhir N, Bouzid D, Herold V, Relationship between subsurface damage depth and breaking strength for brittle materials, Int. J. Adv. Manuf. Technol. 102, 1421( 2019). https:// doi. org / 10.1007 / s00170-018-03284-8.
12 Zhou Y, Funkenbusch PD, Quesnel DJ, Golini D, Lindquist A, Effect of Etching and Imaging Mode on the Measurement of Subsurface Damage in Microground Optical Glasses, J. Am. Ceram. Soc. 77, 3277( 1994). https:// doi. org / 10.1111 / j. 1151-2916.1994. tb04585. x.
13 Lucca DA, Wetteland CJ, Misra A, Klopfstein MJ, Nastasi M, Maggiore CJ, Tesmer JR, Assessment of subsurface damage in polished II – VI semiconductors by ion channeling, Nucl. Instrum. Meth. Phys. Res. B 219 – 220, 611( 2004). https:// doi. org / 10.1016 / j. nimb. 2004.01.129.
14 Menapace JA, Davis PJ, Steele WA, Wong LL, Suratwala TI, Miller PE, in Proceedings of the Boulder Damage Symposium XXXVII: Annual Symposium on Optical Materials for High Power Lasers, Boulder, 2005( SPIE, 2005), p. 599103. https:// doi. org / 10.1117 / 12.638839.
15 Shafrir SN, Lambropoulos JC, Jacobs SD, Subsurface damage and microstructure development in precision microground hard ceramics using magnetorheological finishing spots, Appl. Opt. 46, 5500( 2007). https:// doi. org / 10.1364 / AO. 46.005500.
16 Elfallagh F, Inkson BJ, 3D analysis of crack morphologies in silicate glass using FIB tomography, J. Eur. Ceram. Soc. 29, 47( 2009). https:// doi. org / 10.1016 / j. jeurceramsoc. 2008. 05.042.
17 Neauport J, Cormont P, Legros P, Ambard C, Destribats J, Imaging subsurface damage of grinded fused silica optics by confocal fluorescence microscopy, Opt. Express 17, 3543( 2009). https:// doi. org / 10.1364 / OE. 17.003543.
18 Wang C, Tian A, Wang H, Li B, Jiang Z, in Proceedings of the Fourth International Conference on Experimental Mechanics, Singapore, 2009( SPIE, 2009), 75226K. https:// doi. org / 10.1117 / 12.852363.
19 Neauport J, Ambard C, Cormont P, Darbois N, Destribats J, Luitot C, Rondeau O, Subsurface damage measurement of ground fused silica parts by HF etching techniques, Opt. Express 17, 20448( 2009). https:// doi. org / 10.1364 / OE. 17.020448.
20 Sergeeva M, Khrenikov K, Hellmuth T, Boerret R, Sub surface damage measurements based on short coherent interferometry, J. Eur. Opt. Soc. Rapid. Publ. 5, 10003( 2010). https:// doi. org / 10.2971 / jeos. 2010.10003.
21 Li Y, Huang H, Xie R, Li H, Deng Y, Chen X, et al., A method for evaluating subsurface damage in optical glass, Opt. Express 18, 17180( 2010). https:// doi. org / 10.1364 / OE. 18.017180.
22 Ma B, Shen Z, He P, Ji Y, Sang T, Jiao H, et al., Subsurface quality of polished SiO2 surface evaluated by quasi-Brewster angle technique, Optik. 122, 1418( 2011). https:// doi. org / 10.1016 / j. ijleo. 2010.09.019.
23 Ma B, Shen Z, He P, Sha F, Wang C, Wang B, et al., Evaluation and analysis of polished fused silica subsurface quality by the nanoindenter technique, Appl. Opt. 50, C279- C285( 2011). https:// doi. org / 10.1364 / AO. 50.00C279.
24 Trost M, Herffurth T, Schmitz D, Schröder S, Duparré A, Tünnermann A, Evaluation of subsurface damage by light scattering techniques, Appl. Opt. 52, 6579( 2013). https:// doi. org / 10.1364 / AO. 52.006579.
25 Aida H, Takeda H, Kim S-W, Aota N, Koyama K, Yamazaki T, Doi T, Evaluation of subsurface damage in GaN substrate induced by mechanical polishing with diamond abrasives, Appl. Surf. Sci. 292, 531( 2014). https:// doi. org / 10.1016 / j. apsusc. 2013.12.005.
26 Li HN, Yu TB, Da Zhu L, Wang WS, Evaluation of grindinginduced subsurface damage in optical glass BK7, J. Mater. Process. Technol. 229, 785( 2016). https:// doi. org / 10.1016 / j. jmatprotec. 2015.11.003.
27 Luo J, Huynh H, Pantano CG, Kim SH, Hydrothermal reactions of soda lime silica glass – Revealing subsurface damage and alteration of mechanical properties and chemical structure of glass surfaces, J. Non-Cryst. Solids 452, 93( 2016). https:// doi. org / 10.1016 / j. jnoncrysol. 2016.08.021.
28 Seiler M, Tianis L, Bliedtner J, Berlinger M, Gürtler S, in Proceedings of the Conferences on Optical Technologies, München, 2019( EPJ Web Conferences 215, Les Ulis, 2019), p. 08001. https:// doi. org / 10.1051 / epjconf / 201921508001.
29 Wu X, Gao W, He Y, Liu H, Quantitative measurement of subsurface damage with self-referenced spectral domain optical coherence tomography, Opt. Mater. Express 7, 3919( 2017). https:// doi. org / 10.1364 / OME. 7.003919.
30 Schnurbusch G, Brinksmeier E, Riemer O, Influence of cutting speed on subsurface damage morphology and distribution in ground fused Silica, Inventions 2, 15( 2017). https:// doi. org / 10.3390 / inventions2030015.