J. Eur. Opt. Society-Rapid Publ. 21, 7( 2025) 69
Figure 11. Image of the random features in confocal mode( a) and STED mode( b).
Figure
12. Intensity profile of the random features for confocal mode( a) and STED mode( b). The dotted lines in the STED mode diagram show the approximate border of each feature.
Table 2. Parameters for imaging a random structure on the NV centres substrate.
Parameters |
Values |
Pixel size |
10 nm |
Pinhole size |
1 A. U. |
Dwell time |
10 ls |
Line accumulation |
14 |
Excitation power |
25 % |
STED power |
25 % |
Excitation wavelength |
561 nm |
STED wavelength |
775 nm |
Frame size |
4.5 2 lm 2 |
Table 3. Parameters for imaging the cross-shaped pattern on the NV centres substrate for two cases.
Parameters
Values for Case I
Values for Case II
Pixel size |
20 nm |
10 nm |
Pinhole size |
1 A. U. |
1 A. U. |
Dwell time |
20 ls |
20ls |
Line accumulation |
1 |
1 |
Excitation power |
2 % |
2 % |
STED power |
5 % |
5 % |
Excitation wavelength |
561 nm |
561 nm |
STED wavelength |
775 nm |
775 nm |
Frame size |
15 15 lm 2 |
15 15 lm 2 |
switchable detection channel systems, which might be exploited for non-linear pump-probe SRM methods such as STED or ground state depletion GSD. Positive exceptions might be silicon-based nanostructures, when the plasma dispersion effect can be exploited [ 78 ] or other label-free SRM methods based on plasmonic scattering suppression like in the SAX and SUSI methods described in Section 3. An alternative with a potentially broader application potential might be provided by nonlinear photo-modulated reflectivity [ 79 ].
There exist many applications in nanotechnologies which should be suitable to implement thin inorganic extra layers on top of the substrate or ion dopants within a transparent substrate with alternatives to fluorescence markers, such as NV centres in artificial diamond, quantum dots or Nd-ions, which can be exploited relatively straight forward for RESOLFT-like SRM.
In applications where such extra-layers or dopants are not acceptable and where no other alternatives such as