Global,AFM Probe Market Research Report 2017 AFM Probe Market Emerging Industry Volume (Sales, | страница 2

Global AFM Probe Industry 2017 Market Research Report Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by feeling or touching the surface with a mechanical probe. An AFM probe has a sharp tip on the free-swinging end of a cantilever that is protruding from a holder. The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers. Buy a copy of this research at https://goo.gl/4TAoLV © emarketorg.com [email protected]