Selected Applications
scanning gate microscopy at mK temperatures
attoAFM/CFM on Top-loading Insert
This data was taken with a mK-compatible version of the attoAFM/CFM mounted in a top-loading
insert of a Leiden Cryogenics closed-cycle DR. The sample temperature was 60 mK during an AFM
scan with the speed of 400nm/s. The images nicely demonstrates that the delicate microscope
works very well even under these extreme conditions.
2 µm
attoAFM III on Top-loading Insert
This data was taken with a tuning fork attoAFM III specifically designed for mK operation. The
extremely sensitive microscope was mounted in a top-loading insert, which ensures a much higher
usability in terms of turnaround times upon tip and sample exchange than in case of microscope being
mounted directly on the mixing chamber. The sample temperature in the top-loading DR was 55 mK
during the scan at 100 nm/s. The images nicely demonstrate that the delicate microscope works rea-
sonably well even under these extreme conditions.
2 µm